“Exploring microXRF Technology: Advancing Bulk and Precision Elemental Analyses”
Presented by:
Ben Ruchte, P.E.
Director of Product Engagement
IXRF Systems
This talk explores the potential of micro X-Ray Fluorescence (microXRF) technology to enhance or potentially replace conventional techniques in metallurgical/failure analyses, particularly in the context of ferrous-based components, but certainly not limited to. An overview of microXRF technology, discussing its technological background, advantages, and capabilities will also be provided. MicroXRF technology offers precise elemental mapping with high spatial resolution, non-destructive analysis, and the ability to scan large areas in heavy samples. Additionally, it employs polycapillary optics with enhanced X-ray sources for accurate measurements and trace element detection.
Ben's Bio:
Ben Ruchte is a distinguished professional in materials engineering, metallurgy, and failure analysis, with a journey that spanned over 10 years in the power industry. Currently, he holds a key position at IXRF, where his role revolves around ensuring the success of both external and internal stakeholders. As the Director of Product Engagement, Ben oversees product adoption and usage through pre- and post-sales efforts, fostering robust relationships with customers. His dynamic responsibilities include collaboration with cross-functional teams, such as product development, engineering, software, and the commercial team, to develop effective product engagement strategies and drive customer success. In addition, Ben heads up the service and support team, which allows for continued learnings on appropriate strategies to make continual product improvements.
Ben's expertise in failure analysis traces back to his co-op days with Dominion in Richmond, VA, and has evolved over the years. With a focus on stationary equipment asset management in high-temperature and high-pressure environments, he has managed laboratory failure analyses, on-site non-destructive examinations (NDE), and risk-based engineering assessments for clients globally. Ben’s experience in failure analyses has equipped him with a deep understanding of various technologies, including XRF, EDS, and more. This knowledge has proven instrumental in his role at IXRF, where he plays a crucial part in pushing and educating customers on microXRF technology.
Ben Ruchte's academic background includes a B.S. in Materials Engineering from Purdue University, and he is a licensed Professional Engineer (Metallurgical) in the state of Texas. Prior to his current role at IXRF, he managed Structural Integrity’s Materials Laboratory in Austin, TX. In his spare time, Ben remains active, focusing on longevity, and enjoys quality time with his wife and two children (6 and 4).
